Query Result Set
Skip Navigation Links
   ActiveUsers:2085Hits:25821658Skip Navigation Links
Show My Basket
Contact Us
IDSA Web Site
Ask Us
Today's News
HelpExpand Help
Advanced search

  Hide Options
Sort Order Items / Page
SHI, HAOYUE (1) answer(s).
 
SrlItem
1
ID:   172247


Measuring China’s international technology catchup / Jiang, Renai; Shi, Haoyue ; Jefferson, Gary H   Journal Article
Jiang, Renai Journal Article
0 Rating(s) & 0 Review(s)
Summary/Abstract This article compares China’s science and technology advance with the US, Japan, South Korea, the United Kingdom, Germany, and France. Using World Intellectual Property Organization and United States Patent and Trademark Office data for the number and quality of patent grants issued by foreign patent offices, several results stand out. First, within a short period, 2010–2017, China has registered a dramatic surge in granted patents, narrowing the foreign patent count gap with a number of largeOECD economies. However, quality adjustments show less impressive gains for Chinese patenting, particularly concerning semiconductors, where a large decline in quality accompanied thesurge in patenting. The article places China’s patent performance in a broader context, taking into account, the dimensions of population, geography, and time.
        Export Export